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The JEOL JSM-IT500 is a highly versatile scanning electron microscope (SEM) that can be used for both imaging and analysis of specimens. It can operate in two modes - variable pressure and high vacuum. Variable Pressure mode for imaging and qualitative X-ray analysis of uncoated and delicate material including type specimens pressure may be increased to over 200 pascals, although best image resolution will be obtained at approximately 10-60 pascals
High-vacuum mode for imaging and quantitative analysis at short working distances images may be obtained at magnifications in excess of 10,000x, giving submicron resolution
The SEM can accommodate long working distances for imaging at low magnifications (x20).
The instrument can be used for energy dispersive X-ray spectroscopy (EDX) analysis.
Sample size limits: 10cm x 10cm x 5cm Standard 12mm and 25mm stubs can be accommodated on multi-holder carousels.
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Last Updated: 19th July, 2018