Bench-top Energy Dispersive X-ray Fluorescence Spectrometer

X-ray fluorescence spectrometer used for non destructive qualitative and quantitative elemental analysis. All elements from Z=11 (Na) to Z=92 (U) can be detected. The device allows point as well as line and area scans, for the latter two flat samples are required. As XRF is a surface technique, minimal preparation may be required to expose the material of interest (e.g. if metals are tarnished or corroded)